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Journey to Data Quality by Leo L. Pipino; James D. Funk; Richard Y. Wang

Journey to Data Quality by Leo L. Pipino; James D. Funk; Richard Y. Wang

USD 8.57 USD
SKU: b9aUjZeU
GTIN: 9780262122870
Condition: Very Good

Specifications

BindingHardcover
Book TitleJourney to Data Quality
Weight1 lbs
Product GroupBook
ISBN9780262122870
Publication NameJourney to Data Quality
PublisherMIT Press
Item Length9.2 in
Publication Year2006
TypeTextbook
FormatHardcover
LanguageEnglish
Item Height0.7 in
Item Weight16.1 Oz
Item Width6.4 in
Number Of Pages280 Pages

This textbook covers a lot of ground without feeling overwhelming.

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