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Journey to Data Quality, Pipino, Leo L.,Funk, James D.,Lee, Yang W.,Wang, Richar

Journey to Data Quality, Pipino, Leo L.,Funk, James D.,Lee, Yang W.,Wang, Richar

USD 9.12 USD
SKU: ByFOI3cd
GTIN: 9780262513357
Condition: Like New

Specifications

ISBN9780262513357
Publication NameJourney to Data Quality
PublisherMIT Press
Item Length8.9 in
Publication Year2009
TypeTextbook
FormatTrade Paperback
LanguageEnglish
Item Height0.5 in
Item Weight11 Oz
Item Width6.3 in
Number Of Pages240 Pages

A nice touch in this textbook is the summary boxes at the end of every section.

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